Last edited by Malrajas
Wednesday, July 8, 2020 | History

5 edition of 2001 Design, Automation and Test in Europe 2001 found in the catalog.

2001 Design, Automation and Test in Europe 2001

March 12-16, 2001 in Munich, Germany

by Automation, and Test in Europe Conference and Exhibition (2001 : Munich, Germany) Design

  • 65 Want to read
  • 31 Currently reading

Published by Ieee .
Written in English

    Subjects:
  • Computer Hardware & Operating Systems,
  • Science/Mathematics,
  • Technology,
  • Automation

  • The Physical Object
    FormatPaperback
    Number of Pages850
    ID Numbers
    Open LibraryOL8067453M
    ISBN 100769509932
    ISBN 109780769509938

    Title Design, Automation & Test in Europe Desc:Proceedings of a meeting held March , Munich, Germany. Prod#:CFPPOD ISBN Pages:1, (3 Vols) Format:Softcover Notes: Authorized distributor of all IEEE proceedings TOC:View Table of Contents Publ:Institute of Electrical and Electronics Engineers (IEEE) POD Publ:Curran . G. Frehse, B. H. Krogh, and R. A. Rutenbar, “Verifying Analog Oscillator Circuits using Forward/ Backward Refinement,” Proceedings of the 9th Conference on Design, Automation and Test in Europe (DATE 06), March

    Search the world's most comprehensive index of full-text books. My library. 05.07.2020 Maohua Zhu, Chao Wang, Youwei Zhuo, Wenguang Chen, and Yuan Xie, "Performance Evaluation and Optimization of HBM-Enabled GPU for Data-intensive Applications", Proceedings of IEEE/ACM Design Automation and Test in Europe (DATE),

    B. E. Saglam (Akgul) and V. Mooney, “System-on-a-Chip Processor Synchronization Support in Hardware,” Proceedings of the Design, Automation and Test in Europe Conference (DATE’01), pp. , March Vitae: Birth place: New York City, NY Outstanding Paper Prize, Packard Foundation Fellowship, ($,) National Science Foundation Young and Zelikovsky, A., Improved Approximation Bounds for the Group Steiner Problem, Proc. Conference on Design Automation and Test in Europe, Paris, France, February,


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2001 Design, Automation and Test in Europe 2001 by Automation, and Test in Europe Conference and Exhibition (2001 : Munich, Germany) Design Download PDF EPUB FB2

Design, Automation and Test in Europe Marchin Munich, Germany [Design, Automation, and Test in Europe Conference and Exhibition ( Munich, Germany)] on *FREE* shipping on qualifying offers. Design, Automation and Test in Europe Marchin Munich, Germany. Each year the Design, Automation and Test in Europe Conference presents awards to the authors of the best papers.

The selection is performed by the award committee composed of the Track Chairs Cristiana Bolchini, Theocharis Theocharides, Jaume Abella and Valeria Bertacco and the following members: Borzoo Bonakdarpour, Andrea Calimera, Automation and Test in Europe 2001 book Canal, Luca Carloni.

The Design, Automation and Test in Europe (DATE) conference celebrated in its tenth anniversary. As a tribute to the chip and system-level design and design technology community, this book presents a compilation of the three most influential papers of each year. This provides an excellent historical overview of the evolution of a domain.

Design, Automation & Test in Europe, or DATE is a yearly conference on the topic of electronic design is typically held in March or April of each year, alternating between France and Germany.

It is sponsored by the SIGDA of the Association for Computing Machinery, the EDA Consortium, the European Design and Automation Association (EDAA), the European Conferences: ACM/IEEE.

/ / Design, Automation and Test in Europe Marchin Munich, Germany / Automation, and Test in Europe Conference and Exhibition ( Munich, Germany) Design / / Test Workshop (Etw ): IEEE European / IEEE Computer Society. Cota É, Carro L and Lubaszewski M A method to diagnose faults in linear analog circuits using an adaptive tester Proceedings of the conference on Design, automation and test in Europe, (es) Aburdene M () Book Review, International Journal of Adaptive Control and Signal Processing,(), Online publication date: 1-Feb Add tags for "Design, Automation, and Test in Europe Conference and Exhibition proceedings, Paris, France, March".

Be the first. Similar Items. DATE Best Paper Awards. Each year the Design, Automation and Test in Europe Conference presents awards to the authors of the best papers. The selection is performed by an award committee, based on the results of the reviewing process and the quality of the final paper.

In: Proceedings of the Design, Automation and Test in Europe Conference, pp. – () Google Scholar 8. Ludden, J.M., et al.: Functional verification of the POWER4 microprocessor and POWER4 multiprocessor by: 2.

Flynn, A. Gordon-Ross, and A.D. George. IEEE/ACM Design, Automation and Test in Europe (DATE), April pdf ppt; SCORES: A Scalable and Parametric Streams-Based Communication Architecture for Modular Reconfigurable Systems A.

Jara-Berrocal and A. Gordon-Ross. IEEE/ACM Design, Automation and Test in Europe (DATE), April pdf ppt. Design, Automation & Test in Europe Conference Look at what Springer has for you We've highlighted some of our most interesting offers for you at this conference.

In The Design, Automation and Test in Europe (DATE) conference celebrated its tenth anniversary. As a tribute to the chip and system-level design and design technology community, this book presents a compilation of the three most influential papers of each year. He is an internationally recognized expert on test automation, test development and testing technology management.

He is coauthor of Integrated Test Design and Automation (Addison Wesley, ), and speaks frequently at international testing conferences.

Hans holds a Master of Science in Computer Science from Free University, Amsterdam. Title Design, Automation and Test in Europe Desc:Proceedings of a meeting held MarchMunich, Germany.

Prod#:CFPPOD ISBN Pages:1, (3 Vols) Format:Softcover Notes: Authorized distributor of all IEEE proceedings TOC:View Table of Contents Publ:Institute of Electrical and Electronics Engineers (IEEE) POD Publ:Curran.

Hans Buwalda (), Integrated Test Design and Automation, Addison-Wesley Longman Lee Copeland (), A Practitioner's Guide to Software Test Design, Artech House Rick David Craig and Stefan P. Jaskiel (), Systematic Software Testing, Artech House. Doboli, "Integrated Hardware-Software Co-Synthesis and High-Level Synthesis for Design of Embedded Systems under Power and Latency Constraints", Proceedings of the Design, Automation and Test in Europe Conference,Munich.

Ni M and Memik S Self-heating-aware optimal wire sizing under Elmore delay model Proceedings of the conference on Design, automation and test in Europe, () Yang Y, Zhu C, Gu Z, Shang L and Dick R Adaptive multi-domain thermal modeling and analysis for integrated circuit synthesis and design Proceedings of the IEEE/ACM.

Afshin Abdollahi and Massoud Pedram, “ Analysis and Synthesis of Quantum Circuits by Using Quantum Decision Diagrams, †Proc. ofDesign Automation and Test in Europe, Mar.pp.

Afshin Abdollahi and Massoud Pedram, “ A New Canonical Form for Fast Boolean Matching in Logic Synthesis and Verification,†Proc. SinceI have been a Ph.D (Design Automation and Test in Europe ) Mechanisms for Leakage Current Reduction in CMOS VLSI Circuits,” Proc.

of Symp. on Low Power Electronics and Design, Aug. BOOK CHAPTER. Markov, ``A Physical-design Picture Book'' (review of Practical Problems in VLSI Physical Design Automation by S.K. Lim; ), IEEE Design and Test of Computers, vol. 26, no.

4, July-Aug pp. Book Chapters. E. J. Kim "Bandwidth Efficient On-Chip Interconnect Designs for GPGPUs," in Proceedings of 52nd Design Automation Conference (DAC), San Francisco, CA, June, "Temperature-Aware Scheduler Based on Thermal Behavior Grouping in Multicore Systems," in Design, Automation and Test In Europe (DATE), Nice, France, April.T.

McConaghy, T. Eeckelaert, G. G. E. Gielen, CAFFEINE: template-free symbolic model generation of analog circuits via canonical form functions and genetic programming, in Proc. Design Automation and Test in Europe (DATE), pp.March 7 .G.

Quan and X.S. Hu, Minimum Energy Fixed Priority Scheduling for Variable Voltage Processors, IEEE/ACM Design Automation & Test in Europe (DATE), Selected as one of The Most Influential Papers (three out of total submissions) for the year and collected in the book: The Most Influential Papers of 10 Years DATE, Lauwereins, R.